The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 2015

Filed:

Jul. 02, 2012
Applicant:

Changsi Peng, Jiangsu, CN;

Inventor:

Changsi Peng, Jiangsu, CN;

Assignee:

Soochow University, Jiangsu, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/20 (2006.01); H01L 21/36 (2006.01); H01L 33/00 (2010.01); H01L 21/02 (2006.01); B82Y 20/00 (2011.01); B82Y 40/00 (2011.01); H01S 5/34 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02601 (2013.01); H01L 21/02546 (2013.01); H01L 21/0259 (2013.01); H01L 21/02631 (2013.01); H01L 21/02395 (2013.01); H01L 21/02664 (2013.01); B82Y 20/00 (2013.01); B82Y 40/00 (2013.01); H01S 5/3412 (2013.01); H01S 2304/00 (2013.01); H01S 2304/02 (2013.01); H01S 2304/04 (2013.01);
Abstract

A manufacturing apparatus and a manufacturing method for a quantum dot material. The manufacturing apparatus adds an optical device capable of generating an interference pattern in an existing epitaxial apparatus, so that a substrate applies an interference pattern on an epitaxial layer while performing epitaxial growth. By means of the interference pattern, a regularly distributed temperature field is formed on the epitaxial layer, so that on the epitaxial layer, an atom aggregation phenomenon is formed at dot positions with higher temperature, but no atoms are aggregated on areas having relatively lower temperature. Therefore, according to the temperature distribution on the surface of the epitaxial layer, positions where quantum dots generate can be controlled manually without introducing defects, thereby achieving a defect-free and long-range ordered quantum dot manufacturing.


Find Patent Forward Citations

Peng, Changsi. (2015). Manufacturing apparatus and manufacturing method for quantum dot material (U.S. Patent No. 8969185). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8969185

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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