The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2015
Filed:
Mar. 11, 2010
Makoto Hikage, Miyagi, JP;
Kohsuke Gonda, Miyagi, JP;
Motohiro Takeda, Miyagi, JP;
Takashi Kamei, Miyagi, JP;
Noriaki Ohuchi, Miyagi, JP;
Hideki Gouda, Tokyo, JP;
Yasushi Nakano, Tokyo, JP;
Makoto Hikage, Miyagi, JP;
Kohsuke Gonda, Miyagi, JP;
Motohiro Takeda, Miyagi, JP;
Takashi Kamei, Miyagi, JP;
Noriaki Ohuchi, Miyagi, JP;
Hideki Gouda, Tokyo, JP;
Yasushi Nakano, Tokyo, JP;
Tohoku University, Miyagi, JP;
Konica Minolta Medical & Graphic, Inc., Tokyo, JP;
Abstract
Regions where metastatic cancer cells can exist are detected with high accuracy in a sentinel lymph node. Quantum dots are injected into the vicinity of a cancer in a living body, thereby identifying the location of the sentinel lymph node by means of fluorescence. Subsequently, the sentinel lymph node is extracted. With respect to the sentinel lymph node extracted with quantum dots injected, structural analysis is conducted by means of precision fluorescence measurement which uses a confocal fluorescence microscope for monomolecular observation. Specifically, the fluorescence intensity is measured with respect to each of multiple areas in the sentinel lymph nodes, and out of the multiple areas measured, one or more areas are detected as afferent lymph vessel inflow regions in descending order of fluorescence intensity.