The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 2015
Filed:
Jan. 25, 2006
Mark E. Arnoldussen, San Carlos, CA (US);
Mark E. Arnoldussen, San Carlos, CA (US);
AMO Manufacturing USA, LLC, Santa Anna, CA (US);
Abstract
Systems and methods for testing a laser eye surgery system are provided. Methods include establishing an image scale based on a calibration pattern, imageably altering a series of regions of a test surface with the laser system, laterally redirecting a laser beam to form a test pattern, imaging the test pattern, determining a lateral redirecting characteristic of the beam delivery system, and qualifying or calibrating the beam delivery system. Systems can include an input module that accepts an input member such as a calibration pattern parameter, a calibration pattern image, an intended pattern parameter, a test pattern image, an imaging device position, a calibration pattern position, a test pattern position, and a beam delivery system position, a characterization module that determines a beam delivery system characteristic, and an output module that generates a calibration for the beam delivery system of the laser eye surgery system.