The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2015

Filed:

Jul. 23, 2013
Applicant:

Academia Sinica, Taipei, TW;

Inventors:

Wei-Tse Chang, Taipei, TW;

Ing-Shouh Hwang, Taipei, TW;

Assignee:

Academia Sinica, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 70/10 (2010.01); G01Q 70/16 (2010.01); B82Y 35/00 (2011.01);
U.S. Cl.
CPC ...
G01Q 70/10 (2013.01); G01Q 70/16 (2013.01); B82Y 35/00 (2013.01);
Abstract

Disclosed is a method for fabricating a nanoscale probe. A first conductor and a second conductor are immersed into an electrolyte contained in an electrolytic tank. The first conductor and the second conductor are connected to a power source respectively. An electrolytic reaction is established when an electrical circuit is established between the first conductor and the second conductor. The second conductor is configured to output electrons. The first conductor is configured to receive electrons. Therefore, the first conductor is etched when the electrical circuit is established between the first conductor and the second conductor. A necking portion is created at the first conductor approximately near the surface of the electrolyte. A nanoscale probe is fabricated when first conductor breaks at the necking portion.


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