The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2015

Filed:

Jan. 30, 2009
Applicants:

Shinji Kikuchi, Minato-ku, JP;

Yoshihiro Kanna, Minato-ku, JP;

Yohsuke Isozaki, Minato-ku, JP;

Inventors:

Shinji Kikuchi, Minato-ku, JP;

Yoshihiro Kanna, Minato-ku, JP;

Yohsuke Isozaki, Minato-ku, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
H04L 41/5096 (2013.01); H04L 41/147 (2013.01); H04L 41/5025 (2013.01);
Abstract

A service provision quality control device according to the present invention includes a simulation processing unit which predicts a group of state predicting vector values on the basis of vector values of a current state and a past state of measurement statistic, a judging unit which judges whether a control operation is necessary or not on the basis of the state predicting vector value and a target state vector value whose control target is agreed service level, and an adjusting unit which adjusts evaluation condition of an execution environment repeatedly until control deviation becomes not larger than a predetermined value under the condition that iteration number is not larger than a predetermined value which is corresponding to an upper limit value.


Find Patent Forward Citations

Loading…