The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2015
Filed:
Jun. 20, 2011
Evan M. Hoke, Milpitas, CA (US);
Patrick R. Holley, Santa Clara, CA (US);
Jonathan M. Deutsch, Cupertino, CA (US);
Evan M. Hoke, Milpitas, CA (US);
Patrick R. Holley, Santa Clara, CA (US);
Jonathan M. Deutsch, Cupertino, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
In one embodiment, an automated user-level testing tool is enhanced to capture additional information about the state of the automated testing, beyond just a screenshot of the application-under-test. In another embodiment, an automated user-level testing tool is enhanced to capture testing state information for multiple points in time (referred to as 'snapshots'), beyond just when the application-under-test crashes. This captured information from one execution of an automated test (one 'test run') is stored in one test log, which can then be viewed using a test log viewer. In one embodiment, the graphical user interface (GUI) for the test log viewer includes four areas: a screenshot area, a test script area, a stack trace area, and a timing area. The content shown in the screenshot area, the test script area, and the stack trace area is specific to a particular point in time during a test (e.g., a particular snapshot).