The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2015
Filed:
Dec. 10, 2012
Applicant:
SK Hynix Inc., Icheon-si Gyeonggi-do, KR;
Inventors:
Hyung Gyun Yang, Icheon-si Gyeonggi-do, KR;
Hyung Dong Lee, Icheon-si Gyeonggi-do, KR;
Yong Kee Kwon, Icheon-si Gyeonggi-do, KR;
Young Suk Moon, Icheon-si Gyeonggi-do, KR;
Assignee:
SK Hynix Inc., Gyeonggi-do, KR;
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G11C 29/10 (2006.01); G11C 29/14 (2006.01); G11C 29/36 (2006.01);
U.S. Cl.
CPC ...
G11C 29/10 (2013.01); G11C 29/14 (2013.01); G11C 29/36 (2013.01);
Abstract
A semiconductor memory apparatus includes a test circuit configured to receive a plurality of sequentially-changing test input patterns, compress the received test input patterns at each clock signal, and output the compressed patterns as variable test data.
Yang, Hyung. (2015). Test circuit of semiconductor memory apparatus and semiconductor memory system including the same (U.S. Patent No. 8966331). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8966331
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile