The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8966329 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 24, 2015

Filed:

Jul. 19, 2011
Applicants:

Lawrence T. Clark, Phoenix, AZ (US);

Yu Cao, Gilbert, AZ (US);

Inventors:

Lawrence T. Clark, Phoenix, AZ (US);

Yu Cao, Gilbert, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/08 (2006.01); G11C 29/28 (2006.01); G11C 29/40 (2006.01); G11C 11/41 (2006.01); G11C 29/12 (2006.01); G11C 29/26 (2006.01);
U.S. Cl.
CPC ...
G11C 29/08 (2013.01); G11C 11/41 (2013.01); G11C 29/28 (2013.01); G11C 29/40 (2013.01); G11C 2029/1202 (2013.01); G11C 2029/1204 (2013.01); G11C 2029/2602 (2013.01);
Abstract

In general, each parallel test operation on Static Random Access Memory (SRAM) cells is a test operation performed on a block of the SRAM cells in parallel, or simultaneously. In one embodiment, the SRAM cells are arranged into multiple rows and multiple columns where the columns are further arranged into one or more column groups. The block of the SRAM cells for each parallel test operation includes SRAM cells in two or more of the rows, SRAM cells in two or more columns in the same column group, or both SRAM cells in two or more rows and SRAM cells in two or more columns in the same column group.


Find Patent Forward Citations

Clark, Lawrence. (2015). Fast parallel test of sram arrays (U.S. Patent No. 8966329). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8966329

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