The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2015

Filed:

Feb. 22, 2011
Applicants:

Anthony Fai, Palo Alto, CA (US);

Nir Jacob Wakrat, Los Altos, CA (US);

Nicholas Seroff, Los Gatos, CA (US);

Inventors:

Anthony Fai, Palo Alto, CA (US);

Nir Jacob Wakrat, Los Altos, CA (US);

Nicholas Seroff, Los Gatos, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/362 (2013.01);
Abstract

This document generally describes systems, devices, methods, and techniques for obtaining debug information from a memory device. Debug information can include a variety of information associated with a memory device that can be used for debugging the device, such as a sequence of operations performed by the memory device and information regarding errors that have occurred (e.g., type of error, component of memory device associated with error). A memory device can be instructed by a host to obtain and provide debug information to the host. A memory device can be configured to obtain particular debug information using a variety of features, such as triggers. For instance, a memory device can use a trigger to collect debug information related to failed erase operations.


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