The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2015

Filed:

May. 17, 2012
Applicants:

Dong Min Seo, Daejeon, KR;

Han Min Jung, Daejeon, KR;

Pyung Kim, Daejeon, KR;

MI Kyoung Lee, Daejeon, KR;

Seung Woo Lee, Daejeon, KR;

Won Kyung Sung, Daejeon, KR;

Inventors:

Dong Min Seo, Daejeon, KR;

Han Min Jung, Daejeon, KR;

Pyung Kim, Daejeon, KR;

Mi Kyoung Lee, Daejeon, KR;

Seung Woo Lee, Daejeon, KR;

Won Kyung Sung, Daejeon, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30513 (2013.01);
Abstract

An apparatus and method of searching for an instance path based on an ontology schema are provided. The method of searching for an instance path based on an ontology schema, which is performed by an instance path search apparatus, includes (a) receiving two or more keywords from a user and generating a pair of instances with respect to the keywords, respectively, (b) extracting a pair of classes corresponding to each of the pairs of instances from an ontology instance database, respectively, (c) obtaining an ontology schema path with respect to each of the pairs of classes from an ontology schema path database, respectively, and (d) replacing start and end classes with corresponding first and second instances in each of the ontology schema paths and searching for an instance path connected between the first instance and the second instance, respectively.


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