The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2015
Filed:
Jun. 21, 2010
Vijay Mital, Kirkland, WA (US);
Brian C. Beckman, Newcastle, WA (US);
Jason A. Wolf, Kirkland, WA (US);
Janine Crumb, Redmond, WA (US);
Darryl Ellis Rubin, Duvall, WA (US);
Olivier Colle, Bellevue, WA (US);
Vijay Mital, Kirkland, WA (US);
Brian C. Beckman, Newcastle, WA (US);
Jason A. Wolf, Kirkland, WA (US);
Janine Crumb, Redmond, WA (US);
Darryl Ellis Rubin, Duvall, WA (US);
Olivier Colle, Bellevue, WA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
Interactive and dynamic exploring of filter criteria for large amounts of numerical data having multiple dimensions is described. Exploration occurs without excessive amounts of computation or querying of a database based on a data set summary that may be obtained from a server in a search system and applied by a client device. A data set is summarized so as to capture relationships between distributions of items in the data set along multiple dimensions. To explore filter criteria, a user may interactively adjust a range of values that act as a filter criteria along a dimension and determine an effect on a distribution of items along another dimension. The client device may apply the data summary in reverse to determine, based on user input specifying aspects of a distribution along one dimension, filter criteria for another dimension that would result in the specified distribution.