The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2015
Filed:
Dec. 16, 2010
Shin-yen Liu, Taiping, TW;
Chih-chiang Kao, Gueishan Township, Taoyuan County, TW;
I-lin Liu, Shenkeng Township, Taipei County, TW;
Chun-tai Yen, Taipei, TW;
Shin-Yen Liu, Taiping, TW;
Chih-Chiang Kao, Gueishan Township, Taoyuan County, TW;
I-Lin Liu, Shenkeng Township, Taipei County, TW;
Chun-Tai Yen, Taipei, TW;
Institute for Information Industry, Taipei, TW;
Abstract
A machine tool data acquisition device for processing a plurality of far-end acquisition commands transmitted from a plurality of monitoring devices is provided. The far-end acquisition commands are used for requesting a plurality of parameters from a machine tool, and the plurality of parameters constitute a combination of parameters, including: a monitoring device connection module for receiving the plurality of far-end acquisition commands from the plurality of monitoring devices; a command establishing module for establishing a plurality of near-end acquisition commands according to the far-end acquisition commands, wherein there is an sequence among the plurality of near-end acquisition commands, and each near-end acquisition command corresponds to a plurality of parameter acquisition requests used for requesting and acquiring all of the parameters of one combination of parameters; and a machine tool connection module for sequentially transmitting the parameter acquisition requests corresponding to the near-end commands to the machine tool according to the sequence among the near-end acquisition commands, and acquiring the parameters corresponding to the parameter acquisition requests from the machine tool.