The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2015

Filed:

Feb. 06, 2013
Applicant:

Illumina, Inc., San Diego, CA (US);

Inventor:

Tobias Mann, Carlsbad, CA (US);

Assignee:

Illumina, Inc., San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G06N 99/00 (2010.01); G06F 19/22 (2011.01); G06F 19/24 (2011.01);
U.S. Cl.
CPC ...
G06N 99/005 (2013.01); G06F 19/22 (2013.01); G06F 19/24 (2013.01);
Abstract

A system for determining the quality of predicted DNA base identifications is disclosed, the system comprising a processor configured to receive a training data set, the training data set comprising a plurality of predicted DNA base identifications, define a group of subsets, compare the predicted DNA base identifications with actual DNA base identifications for training data within each subset of the group, determine a sampling characteristic for each subset of the group based on training data within the respective subset, and determine a quality characterization for predicted DNA base identifications within at least one of subset of the group based on the comparison and determined sampling characteristic, wherein the sampling characteristic comprises a confidence value comprising a binomial proportion confidence interval value.


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