The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2015

Filed:

Oct. 26, 2011
Applicants:

Xiao-yi Zhang, Niederrohrdorf, CH;

Lucas Fischer, Uster, CH;

Evan Foy, Baden, CH;

Inventors:

Xiao-Yi Zhang, Niederrohrdorf, CH;

Lucas Fischer, Uster, CH;

Evan Foy, Baden, CH;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05D 13/02 (2006.01); G05B 17/02 (2006.01); G05B 13/04 (2006.01);
U.S. Cl.
CPC ...
G05B 17/02 (2013.01); G05B 13/041 (2013.01);
Abstract

A method for ascertaining process values for a process control is provided. The method includes detecting a measured value, providing a model that simulates the process, and, on the basis of the model, calculating a calculated real value and a calculated measured value. The method also includes comparing the calculated real value with the calculated measured value to obtain a delay compensation value, and adding the delay compensation value to the measured value to obtain an accelerated value indicative of the process value to be ascertained.


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