The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2015

Filed:

Nov. 09, 2011
Applicants:

Gal Kaminka, Kfar Saba, IL;

Eran Sadeh-or, Givataim, IL;

Inventors:

Gal Kaminka, Kfar Saba, IL;

Eran Sadeh-Or, Givataim, IL;

Assignee:

Bar-Ilan University, Ramat Gan, IL;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4671 (2013.01);
Abstract

Methods and apparatus for image matching using local features, in particular a method and apparatus for flexible interest point computation. The method involves producing multiple octaves of a digital image, wherein each octave of said multiple scale octaves comprises multiple layers; initiating a process comprising detection and description of interest points, wherein said process is programmed to progress layer-by-layer over said multiple layers of each of said multiple octaves, and to continue to a next octave of said multiple octaves upon completion of all layers of a current octave of said multiple octaves; upon the detection and the description of each interest point of said interest points during said process, recording an indication associated with said interest point in a memory, such that said memory accumulates indications during said process; and upon interruption to said process, returning a result being based at least on said indications.


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