The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2015
Filed:
Nov. 18, 2010
Applicants:
Sharon X. Wang, Highland Heights, OH (US);
Thomas Laurence, North Royalton, OH (US);
David Sowards-emmerd, Sunnyvale, CA (US);
Inventors:
Sharon X. Wang, Highland Heights, OH (US);
Thomas Laurence, North Royalton, OH (US);
David Sowards-Emmerd, Sunnyvale, CA (US);
Assignee:
Koninklijke Philips N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0026 (2013.01); G06T 11/008 (2013.01); G06T 2200/32 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/10088 (2013.01);
Abstract
A method of aligning multiple volumetric sections of imaging data is provided. The method comprises aligning a primary volumetric section and a secondary volumetric section which is adjacent to the primary volumetric imaging section, for moving the secondary volumetric section into alignment with the primary volumetric section. A related apparatus for performing the method is also provided.