The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2015

Filed:

Jan. 13, 2011
Applicants:

Francisco Garcia, San Diego, CA (US);

Klaus Maisinger, Essex, GB;

Stephen Tanner, San Diego, CA (US);

John Moon, San Diego, CA (US);

Tobias Mann, San Diego, CA (US);

Michael Lawrence Parkinson, Reyrieux, FR;

Anthony James Cox, Essex, GB;

Haifang H. GE, Essex, GB;

Inventors:

Francisco Garcia, San Diego, CA (US);

Klaus Maisinger, Essex, GB;

Stephen Tanner, San Diego, CA (US);

John Moon, San Diego, CA (US);

Tobias Mann, San Diego, CA (US);

Michael Lawrence Parkinson, Reyrieux, FR;

Anthony James Cox, Essex, GB;

Haifang H. Ge, Essex, GB;

Assignee:

Illumina, Inc., San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01); G06T 7/20 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 7/0028 (2013.01); G06T 7/2033 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/30024 (2013.01);
Abstract

Methods and systems for analysis of image data generated from various reference points. Particularly, the methods and systems provided are useful for real time analysis of image and sequence data generated during DNA sequencing methodologies.


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