The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2015
Filed:
Sep. 15, 2011
Tobias Schmitt-manderbach, Jena, DE;
Daniel Bublitz, Rausdorf, DE;
Roland Bergner, Jena, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
Determination of biometric parameters of an eye, in which the optical axis of the biometric measurement system is aligned to the optical axis of an eye. The device includes an interferometry measuring arrangement having a measurement light source and a measurement sensor, a fixation light source for capturing the eye with the reflexes that arise, an image sensor, and lens for detecting volume scattered light and an analysis unit for determining the angular deviation of the optical axis of the eye from the optical axis of the biometric measurement system. The analysis unit compares determined angular deviation to a predefined tolerance and, laterally displaces fixation marks on the basis of the calculated angular deviation, or of initiating the biometric measurement.