The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2015

Filed:

Jan. 06, 2012
Applicant:

Shigeharu Kimura, Yokohama, JP;

Inventor:

Shigeharu Kimura, Yokohama, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 7/26 (2006.01); G11B 7/00 (2006.01); G02B 21/00 (2006.01); G02B 27/28 (2006.01); G11B 7/1353 (2012.01); G11B 7/1395 (2012.01);
U.S. Cl.
CPC ...
G02B 21/0092 (2013.01); G02B 27/283 (2013.01); G11B 7/1353 (2013.01); G11B 7/1395 (2013.01);
Abstract

An optical system capable of obtaining a high-resolution image using interference and thus capable of providing a stable signal is realized. A particular polarization state of response light emitted from an object is selected, and light in the selected particular polarization state is split into two beams. The split two beams are polarized into two different polarization states. After one of the two beams is subjected to an image inversion, the two beams are condensed such that they interfere with each other. The interfering light is split into a plurality of beams, and each of these beams is detected after they are passed through different polarizing filters. Detected signals are combined together and processed to obtain high-stability amplitude information without being influenced by a phase difference between the two beams.


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