The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2015
Filed:
Dec. 27, 2013
Seagate Technology Llc, Cupertino, CA (US);
Hamid Ghazvini, San Jose, CA (US);
David Kuo, Palo Alto, CA (US);
Minh Huong Le, San Jose, CA (US);
Kim Yang Lee, Fremont, CA (US);
HongYing Wang, Fremont, CA (US);
Nobuo Kurataka, Campbell, CA (US);
Yautzong Hsu, Fremont, CA (US);
Henry Hung Yang, San Jose, CA (US);
Seagate Technology LLC, Cupertino, CA (US);
Abstract
A system and method of calibrating optical measuring equipment includes optically measuring discrete objects of a first known predictable pattern from a calibration apparatus, wherein the first known predictable pattern is a bit pattern. A recording surface optical reader is calibrated based on the optically measuring. Using the first known predictable pattern, contamination is filtered from the results of the optically measuring.