The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2015

Filed:

Nov. 29, 2011
Applicant:

Shimpei Matsuo, Tokyo, JP;

Inventor:

Shimpei Matsuo, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/40 (2006.01); G06K 15/02 (2006.01); H04N 1/401 (2006.01); G06K 15/12 (2006.01); G03G 15/00 (2006.01); G03G 13/04 (2006.01);
U.S. Cl.
CPC ...
G06K 15/1868 (2013.01); H04N 1/40031 (2013.01); H04N 1/4015 (2013.01); G06K 15/1209 (2013.01); G06K 15/1247 (2013.01);
Abstract

An image forming apparatus of this invention, when an exposure unit performs exposure, applies, to image data quantized by a first number of bits, compensation data for compensating for unevenness of the exposure intensity occurring on a photosensitive member caused by a lens array used in the exposure unit. This compensation data is obtained by quantizing, by a second number of bits larger than the first number of bits, data corresponding to a change in measurement value obtained by measuring unevenness of exposure occurring on the photosensitive member from a reference value used in the measurement, and requantizing the quantized data by the first number of bits by using sigma-delta modulation.


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