The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2015

Filed:

Mar. 05, 2013
Applicants:

Naohiro Kamijo, Kanagawa, JP;

Kohei Shimbo, Kanagawa, JP;

Yoichi Kubota, Tokyo, JP;

Manabu Seo, Kanagawa, JP;

Inventors:

Naohiro Kamijo, Kanagawa, JP;

Kohei Shimbo, Kanagawa, JP;

Yoichi Kubota, Tokyo, JP;

Manabu Seo, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/40 (2006.01); G01J 3/42 (2006.01); G01J 3/02 (2006.01); G01J 3/18 (2006.01); G01J 3/50 (2006.01); G03G 15/00 (2006.01);
U.S. Cl.
CPC ...
G01J 3/42 (2013.01); G01J 3/0297 (2013.01); G01J 3/18 (2013.01); G01J 3/2823 (2013.01); G01J 3/50 (2013.01); G03G 15/00 (2013.01); G01J 3/0208 (2013.01); G01J 3/024 (2013.01); G01J 3/0229 (2013.01); G01J 3/0262 (2013.01); G01J 2003/503 (2013.01);
Abstract

A spectrometer includes a light source to project a light beam to a target object, an optical element including a plurality of apertures through which the light beam reflected by the target object transmits, a diffraction element to form diffracted images from a plurality of light beams having transmitted through the optical element, and a light receiving element to receive the diffracted images formed by the diffraction element and including an optical shield to block a diffracted image other than a certain-order diffracted image.


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