The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2015

Filed:

Jul. 20, 2011
Applicants:

Masaya Itoh, Hitachinaka, JP;

Yuan LI, Hitachi, JP;

Takashi Saeki, Hitachinaka, JP;

Yasuhiro Suda, Hitachi, JP;

Inventors:

Masaya Itoh, Hitachinaka, JP;

Yuan Li, Hitachi, JP;

Takashi Saeki, Hitachinaka, JP;

Yasuhiro Suda, Hitachi, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/47 (2006.01); G06K 9/40 (2006.01); G06K 9/00 (2006.01); H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
G06K 9/40 (2013.01); G06K 9/00771 (2013.01); H04N 7/181 (2013.01);
Abstract

A camera surveillance system having a camera malfunction function includes an entire feature extraction unit to extract each entire feature from an input image and a reference image; a block feature extraction unit to extract block features being features of each block from images after the block division of the input image and the reference image divided into blocks by a block division unit; and a malfunction determination unit to calculate a first variation between the entire features of the reference image and the entire features of the input image, and a second variation between the block features of the reference image and the block features of the input image, to determine a camera malfunction by using a threshold, and output information indicating a type of the camera malfunction for each block.


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