The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2015

Filed:

Jun. 06, 2011
Applicants:

Chan Min Park, Seoul, KR;

Tack Don Han, Seoul, KR;

Jeong Soo Park, Gwacheon-si, KR;

Jae Ho Nah, Seoul, KR;

Yun Hye Jung, Seoul, KR;

Inventors:

Chan Min Park, Seoul, KR;

Tack Don Han, Seoul, KR;

Jeong Soo Park, Gwacheon-si, KR;

Jae Ho Nah, Seoul, KR;

Yun Hye Jung, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/06 (2011.01);
U.S. Cl.
CPC ...
G06T 15/06 (2013.01);
Abstract

Provided is an image processing apparatus. The image processing apparatus may perform an intersection test for rendering of a ray tracing scheme. The image processing apparatus may include a first calculator and a second calculator. The first calculator may perform a ray-plane test to determine whether a ray intersects a plane including a primitive and a barycentric test to determine whether the ray intersects the primitive. The second calculator may calculate a hit point based on the ray which intersects the primitive.


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