The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2015
Filed:
Aug. 31, 2011
Wrichik Basu, Bangalore, IN;
Manoj Kumar Koyithitta Meethal, Bangalore, IN;
Sakethraman Mahalingam, Bangalore, IN;
Rajesh Veera Venkata Lakshmi Langoju, Bangalore, IN;
Parama Ghoshal, Kolkata, IN;
Wrichik Basu, Bangalore, IN;
Manoj Kumar Koyithitta Meethal, Bangalore, IN;
Sakethraman Mahalingam, Bangalore, IN;
Rajesh Veera Venkata Lakshmi Langoju, Bangalore, IN;
Parama Ghoshal, Kolkata, IN;
General Electric Company, Schenectady, NY (US);
Abstract
Transducer configurations and methods for transducer positioning in electrical impedance tomography are provided. A plurality of transducers for one electrical impedance tomography arrangement are configured for positioning proximate a surface of an object and spaced apart along the object, wherein the transducers are one or more conductive rings and have at least one non-conductive portion. The arrangement further includes one or more excitation drivers coupled to the plurality of transducers and configured to generate excitation signals for the plurality of transducers. The arrangement also includes one or more response detectors coupled to the plurality of transducers and configured to measure a response of the object at the plurality of transducers to the excitation applied by the plurality of transducers based on the excitation signals. The arrangement additionally includes a soft-field reconstruction module configured to reconstruct a property distribution based on the excitation signals and the measured response.