The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2015
Filed:
Nov. 29, 2010
Applicants:
Shingo Itoh, Tokyo, JP;
Shinichi Zenbutsu, Tokyo, JP;
Inventors:
Shingo Itoh, Tokyo, JP;
Shinichi Zenbutsu, Tokyo, JP;
Assignee:
Sumitomo Bakelite Co., Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/29 (2006.01); H01L 23/31 (2006.01); C08G 59/62 (2006.01); C08G 59/68 (2006.01); C08K 3/26 (2006.01); C08L 63/00 (2006.01); H01L 23/495 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
H01L 23/3107 (2013.01); C08G 59/621 (2013.01); C08G 59/688 (2013.01); C08K 3/26 (2013.01); C08L 63/00 (2013.01); H01L 23/293 (2013.01); H01L 23/3164 (2013.01); H01L 23/495 (2013.01); H01L 24/48 (2013.01); H01L 23/49513 (2013.01); H01L 24/45 (2013.01); H01L 2224/05624 (2013.01); H01L 2224/32245 (2013.01); H01L 2224/45147 (2013.01); H01L 2224/45565 (2013.01); H01L 2224/45664 (2013.01); H01L 2224/48091 (2013.01); H01L 2224/48247 (2013.01); H01L 2224/48465 (2013.01); H01L 2224/73265 (2013.01); H01L 2224/83101 (2013.01); H01L 2224/83855 (2013.01); H01L 2924/01004 (2013.01); H01L 2924/01005 (2013.01); H01L 2924/01006 (2013.01); H01L 2924/01012 (2013.01); H01L 2924/01013 (2013.01); H01L 2924/01014 (2013.01); H01L 2924/01016 (2013.01); H01L 2924/01018 (2013.01); H01L 2924/0102 (2013.01); H01L 2924/01022 (2013.01); H01L 2924/01027 (2013.01); H01L 2924/01029 (2013.01); H01L 2924/0103 (2013.01); H01L 2924/01038 (2013.01); H01L 2924/0104 (2013.01); H01L 2924/01046 (2013.01); H01L 2924/01056 (2013.01); H01L 2924/01057 (2013.01); H01L 2924/01078 (2013.01); H01L 2924/01079 (2013.01); H01L 2924/01082 (2013.01); H01L 2924/01083 (2013.01); H01L 2924/01105 (2013.01); H01L 2924/014 (2013.01); H01L 2924/14 (2013.01); H01L 2924/12044 (2013.01); H01L 2924/01019 (2013.01); H01L 2924/01023 (2013.01); H01L 2924/01033 (2013.01); H01L 2924/01075 (2013.01); H01L 2224/48624 (2013.01); H01L 2224/48799 (2013.01); H01L 2924/00015 (2013.01); H01L 2224/45144 (2013.01);
Abstract
An epoxy resin composition for semiconductor encapsulation of the present invention contains an epoxy resin (A) and a curing agent (B) and is used to encapsulate a copper wire () and a semiconductor element () connected to this copper wire (). This epoxy resin composition is such that when a cured product of the epoxy resin composition is heated for 10 hours at 200° C., the amount of generation of a first corrosive gas that is a sulfur compound having corrosiveness to the copper wire () is less than or equal to 70 ppm.