The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2015

Filed:

Dec. 11, 2008
Applicants:

Chung Hsuan Chen, Taipei, TW;

Wen-ping Peng, Taipei, TW;

Ming Lee Chu, Sijhih, TW;

Huan Cheng Chang, Taipei, TW;

Huan-chang Lin, Fongllin Township, Hualien County, TW;

Inventors:

Chung Hsuan Chen, Taipei, TW;

Wen-Ping Peng, Taipei, TW;

Ming Lee Chu, Sijhih, TW;

Huan Cheng Chang, Taipei, TW;

Huan-Chang Lin, Fongllin Township, Hualien County, TW;

Assignee:

Academia Sinica, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
H01J 49/4265 (2013.01);
Abstract

A novel system and method for charge-monitoring mass spectrometry is provided. The mass spectrometer can be used to measure the mass of one or more analytes having masses in the range of about a few Daltons to more than about 10Daltons. The invention can be used for rapid mass distribution measurements. For example, the system and method can be used to distinguish cancer cells from normal cells when their mass distributions are different.


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