The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2015

Filed:

Aug. 31, 2009
Applicants:

Andrew G. Norman, Evergreen, CO (US);

Aaron J. Ptak, Littleton, CO (US);

William E. Mcmahon, Denver, CO (US);

Inventors:

Andrew G. Norman, Evergreen, CO (US);

Aaron J. Ptak, Littleton, CO (US);

William E. McMahon, Denver, CO (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C30B 21/02 (2006.01); H01L 21/02 (2006.01); H01L 29/04 (2006.01); H01L 29/20 (2006.01);
U.S. Cl.
CPC ...
H01L 21/0254 (2013.01); H01L 21/0237 (2013.01); H01L 21/02425 (2013.01); H01L 21/02433 (2013.01); H01L 21/02609 (2013.01); H01L 29/04 (2013.01); H01L 29/2003 (2013.01);
Abstract

Disclosed embodiments include methods of fabricating a semiconductor layer or device and devices fabricated thereby. The methods include, but are not limited to, providing a substrate having a cubic crystalline surface with a known lattice parameter and growing a cubic crystalline group III-nitride alloy layer on the cubic crystalline substrate by coincident site lattice matched epitaxy. The cubic crystalline group III-nitride alloy may be prepared to have a lattice parameter (a') that is related to the lattice parameter of the substrate (a). The group III-nitride alloy may be a cubic crystalline InGaAlN alloy. The lattice parameter of the InGaAlN or other group III-nitride alloy may be related to the substrate lattice parameter by (a′)=√2(a) or (a′)=(a)/√2. The semiconductor alloy may be prepared to have a selected band gap.


Find Patent Forward Citations

Loading…