The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 2015

Filed:

Jul. 26, 2012
Applicants:

Atsushi Yamazaki, Saitama, JP;

Tatsuhiko Okada, Saitama, JP;

Mamoru Yorimoto, Kanagawa, JP;

Daisaku Horikawa, Saitama, JP;

Makoto Moriwaki, Kanagawa, JP;

Inventors:

Atsushi Yamazaki, Saitama, JP;

Tatsuhiko Okada, Saitama, JP;

Mamoru Yorimoto, Kanagawa, JP;

Daisaku Horikawa, Saitama, JP;

Makoto Moriwaki, Kanagawa, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 29/38 (2006.01); H04N 1/047 (2006.01);
U.S. Cl.
CPC ...
B41J 29/38 (2013.01); H04N 1/047 (2013.01); H04N 2201/0471 (2013.01); H04N 2201/04767 (2013.01);
Abstract

A disclosed image forming apparatus includes a reading unit including a light emitting element for emitting light to a record medium, and a light receiving element for receiving reflected light; a print data storing unit storing print data of a uniform pattern which has a color different from a color of the test pattern and is provided in an area including the test pattern, a pattern forming unit printing the test pattern on the uniform pattern after the uniform pattern is printed, a relatively moving unit moving the record medium or the reading unit relatively at a constant speed, a first detection data obtaining unit obtaining first detection data received as the reflection light while the light moves and impinges on the test pattern, and a position detecting unit providing a calculation for determining a position of a line of the test pattern to detect the test pattern.


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