The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 24, 2015
Filed:
Jul. 12, 2012
Chun-ming Huang, Hsinchu, TW;
Chen-chia Chen, Hsinchu, TW;
Chi-sheng Lin, Hsinchu, TW;
Chien-ming Wu, Hsinchu, TW;
Chun-ming Huang, Hsinchu, TW;
Chen-chia Chen, Hsinchu, TW;
Chi-sheng Lin, Hsinchu, TW;
Chien-ming Wu, Hsinchu, TW;
National Applied Research Laboratories, Hsinchu, TW;
Abstract
A microparticle detecting apparatus is disclosed and includes at least one detection unit, each of which includes: a first sieve having at least a first mesh, a separator stacked on one side of the first sieve and having a separator hole, and a second sieve stacked on one side of the separator and having several second meshes. The diameter of the second mesh is smaller than that of the first mesh, and the first and second meshes are misaligned with each other in a vertical direction of the first and second sieves. The detection unit further includes at least a sensor aligned with the first or second mesh for detecting microparticles trapping into the first mesh or passing through the second mesh. Therefore, the microparticle detecting apparatus is suitably used for detecting or counting any microparticles with different size, to effectively shorten the detection processes of sample fluids.