The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2015

Filed:

Oct. 03, 2006
Applicant:

Hideki Hirayama, Akashi, JP;

Inventor:

Hideki Hirayama, Akashi, JP;

Assignee:

Sysmex Corporation, Kobe, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 31/00 (2006.01); G06G 7/48 (2006.01); G06G 7/58 (2006.01); G06F 19/00 (2011.01); G06Q 50/24 (2012.01);
U.S. Cl.
CPC ...
G06F 19/363 (2013.01); G06Q 50/24 (2013.01);
Abstract

A sample analyzer comprising: a measurement section for measuring a sample of an animal; a memory for storing a measurement data by the measurement section; an analysis section for analyzing the measurement data stored on the memory in accordance with a first analysis condition corresponding to a previous setting of a species of an animal; and a selection receiver for receiving a selection of a species of an animal, which is different from the species of the previous setting, after analyzing the measurement data by the analysis section; wherein the analysis section analyzes the measurement data stored on the memory in accordance with a second analysis condition corresponding to the selection of a species of an animal when the selection receiver receives the selection of a species of an animal, is disclosed. A sample analyzing method is also disclosed.


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