The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2015
Filed:
Nov. 07, 2011
William A. Von Drasek, Oak Forest, IL (US);
Sammy Lee Archer, Lynnwood, WA (US);
Gary S. Furman, Jr., Saint Charles, IL (US);
William A. Von Drasek, Oak Forest, IL (US);
Sammy Lee Archer, Lynnwood, WA (US);
Gary S. Furman, Jr., Saint Charles, IL (US);
Nalco Company, Naperville, IL (US);
Abstract
The invention embodies methods and apparatuses to monitor and control the characteristics of a creping process. The method involves measuring optical properties of various points along a creped paper sheet and converting those measurements into characteristic defining data. The invention allows for determining the magnitude and distribution of crepe structures and their frequency and distribution. This allows for the generation of information that is accurate and is much more reliable than the coarse guessing that is currently used in the industry. Feeding this information to papermaking process equipment can result in increases in both quality and efficiency in papermaking.