The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2015

Filed:

May. 30, 2013
Applicant:

Seiko Epson Corporation, Tokyo, JP;

Inventors:

Yuanyuan Ding, Santa Clara, CA (US);

Jing Xiao, Cupertino, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/6201 (2013.01);
Abstract

Aspects of the present invention include feature point matching systems and methods. In embodiments, a tree model is used to find candidate matching features for query feature points. In embodiments, the tree model may be pre-learned using a set of sample images, or alternatively, the tree model may be constructed using one or more of the input images. In embodiments, features in one of the stereo images are registered with the tree model, and then features from the other stereo image are queried through the tree model to identify their correspondences in the registered stereo image. As compared to prior brute force matching methodologies, embodiments disclosed herein reduce the complexity and calculation time for determining matching feature points in stereo images.


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