The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2015
Filed:
Jun. 09, 2010
Xiaoming Su, Shenzhen, CN;
Yujie LI, Shenzhen, CN;
Xiaoming Su, Shenzhen, CN;
Yujie Li, Shenzhen, CN;
ZTE Corporation, Shenzhen, Guangdong Province, CN;
Abstract
A method and system for measuring noise of a machine are disclosed by the present invention, and the method includes: acquiring a first noise interference set, searching for noise interferences which are less than a preset noise interference threshold from the first noise interference set to obtain a second noise interference set, and then calculating an average value of the second noise interference set; and determining whether the average value of the second noise interference set is less than or equal to a set threshold, and if the average value of the second noise interference set is less than or equal to the set threshold, the current noise of the machine is equal to the average value of the second noise interference set. With the present invention, a more accurate measurement value of the noise of the machine can be obtained.