The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2015
Filed:
Sep. 06, 2011
Dietmar Hepper, Hannover, DE;
Oliver Theis, Kalletal, DE;
Xiaoming Chen, Hannover, DE;
Herbert Hoelzemann, Villingen, DE;
Gael Pilard, Wankheim, DE;
Dietmar Hepper, Hannover, DE;
Oliver Theis, Kalletal, DE;
Xiaoming Chen, Hannover, DE;
Herbert Hoelzemann, Villingen, DE;
Gael Pilard, Wankheim, DE;
Thomson Licensing, , FR;
Abstract
In accordance with an exemplary embodiment of the present invention, a method for measuring a quality parameter of an optical storage system comprising a non-diffraction-limited optical storage medium and a readout device, the method comprising the process of deriving an impulse response of the optical storage system, and the process of analyzing the impulse response to determine at least one of a width of the impulse response and a skewness of the impulse response as the quality parameter.