The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2015

Filed:

Mar. 21, 2012
Applicants:

Toshiyuki Hattori, Tokyo, JP;

Hiromi Utsunomiya, Tokyo, JP;

Inventors:

Toshiyuki Hattori, Tokyo, JP;

Hiromi Utsunomiya, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/006 (2013.01); G02B 21/008 (2013.01); G02B 21/0076 (2013.01); G02B 21/367 (2013.01);
Abstract

A laser microscope that efficiently performs 3D imaging irrespective of the shape of a specimen, includes an area segmenting section that segments an observation range of a specimen in the direction perpendicular to the optical axis of an objective lens into many areas; a surface-position storing section that stores motorized stage positions in association with the specimen surface positions, for the many areas; a surface-shape estimating section that estimates the specimen surface shape from the motorized stage positions and the specimen surface positions for the many areas; a z-scanning condition determining section that determines the specimen surface positions at desired positions of the motorized stage from the specimen surface shape; and a light detecting section that detects light from the specimen over certain ranges specified with reference to the specimen surface positions, in the optical axis direction of the objective lens.


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