The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2015
Filed:
Dec. 13, 2013
Canon Kabushiki Kaisha, Tokyo, JP;
Akiko Tokumaru, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An inspection apparatus includes a receiving unit configured to receive preprint image data preprinted on a sheet and document image data printed on the preprinted sheet, a composing unit configured to compose reference image data from the received preprint image data and the received document image data, a reading unit configured to read the sheet on which both the preprint image data and the document image data has been printed, to obtain read image data, a processing unit configured to carry out predetermined image process on a first and second area corresponding to the document image data and the preprint image data of the read image data, to generate inspection image data, and an inspecting unit configured to inspect the sheet on which both the preprint image data and the document image data has been printed, by comparing the inspection image data with the reference image data.