The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2015

Filed:

Nov. 15, 2011
Applicants:

Michel Pierre Bonin, Danville, CA (US);

Thomas Lawrence Harvill, Alamo, CA (US);

Jared Hubert Hoog, Fairfield, CA (US);

Inventors:

Michel Pierre Bonin, Danville, CA (US);

Thomas Lawrence Harvill, Alamo, CA (US);

Jared Hubert Hoog, Fairfield, CA (US);

Assignee:

Process Metrix, Pleasanton, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 25/72 (2006.01); G01S 17/88 (2006.01); G01B 11/06 (2006.01); G01S 17/02 (2006.01); F27D 21/00 (2006.01);
U.S. Cl.
CPC ...
G01S 17/88 (2013.01); G01N 25/72 (2013.01); G01B 11/06 (2013.01); G01S 17/023 (2013.01); F27D 2021/0085 (2013.01);
Abstract

Apparatuses, systems, and methods to monitor the integrity of a container protected by a refractory material are disclosed having a first radiation detector to measure an external surface temperature of the container, a first radiation source to measure a thickness of the refractory material, and a central controller configured to display to a user the measurement of the external surface temperature of the container and the measurement of the thickness of the refractory material.


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