The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2015
Filed:
Jun. 03, 2010
Applicants:
Frank Thiel, Ober-Ramstadt, DE;
Peter Fornoff, Reichelsheim, DE;
Joachim Pfeiffer, Bensheim, DE;
Inventors:
Assignee:
Sirona Dental Systems GmbH, Bensheim, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 9/47 (2006.01); G01B 11/25 (2006.01); A61B 5/00 (2006.01); A61C 13/00 (2006.01); A61B 5/103 (2006.01);
U.S. Cl.
CPC ...
G01B 11/25 (2013.01); A61B 5/0088 (2013.01); A61C 13/0004 (2013.01); G01B 11/2527 (2013.01); A61B 5/0077 (2013.01); A61B 5/103 (2013.01);
Abstract
A method for recording an image of an object includes projecting a strip pattern onto the object, recording the projected strip pattern as raw image data using a camera, and calculating an image of the object from the raw image data. A strip pattern having a duty cycle of less than 1 can be used to increase measuring precision during measurement of a translucent object, and can eliminate a need for additional contrast agents for a recording of the object.