The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2015
Filed:
Dec. 02, 2010
Koji Shimazawa, Tokyo, JP;
Masaaki Kaneko, Tokyo, JP;
Takashi Honda, Hong Kong, HK;
Yoichi Mugino, Kyoto, JP;
Yoshito Nishioka, Kyoto, JP;
Tsuguki Noma, Kyoto, JP;
Koji Shimazawa, Tokyo, JP;
Masaaki Kaneko, Tokyo, JP;
Takashi Honda, Hong Kong, HK;
Yoichi Mugino, Kyoto, JP;
Yoshito Nishioka, Kyoto, JP;
Tsuguki Noma, Kyoto, JP;
TDK Corporation, Tokyo, JP;
Rohm Co., Ltd., Kyoto, JP;
Abstract
Provided is a method for performing a burn-in test on an object under test in which a plurality of electrodes are provided in positions at different heights. The method comprising steps of: preparing an object under test in which an electrode in a higher position have a higher surface roughness among the plurality of electrodes; bringing a plurality of sheet-type probes into contact with the plurality of electrodes, respectively; and supplying an electric current with the plurality of electrodes through the plurality of sheet-type probes. By implementing the method, the sheet-type probes can be kept in stable contact with the electrodes because electrodes in a higher position have a higher surface roughness Ra than electrodes in a lower position. Consequently, stable and reliable burn-in test can be performed.