The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2015

Filed:

Apr. 20, 2012
Applicants:

Angelo Truncale, Lake Forest, CA (US);

James K. Gingrich, Newark, OH (US);

Stephen T. Butscher, Huntington Beach, CA (US);

Joseph E. Justin, Corona, CA (US);

Inventors:

Angelo Truncale, Lake Forest, CA (US);

James K. Gingrich, Newark, OH (US);

Stephen T. Butscher, Huntington Beach, CA (US);

Joseph E. Justin, Corona, CA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F42B 15/01 (2006.01); G01C 21/10 (2006.01); F42B 15/00 (2006.01); G01C 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Inertial measurement unit apparatus for use with guidance systems are disclosed herein. An example guidance system includes an inertial measurement unit removably coupled in a cavity of a guidance wafer via an access port of the guidance wafer defining a port axis that is non-parallel relative to a longitudinal axis of the guidance wafer.


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