The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2015
Filed:
Jul. 28, 2011
Ron Jay Barnett, Santa Rosa, CA (US);
Gregory Stephen Gonzales, Sebastopol, CA (US);
Ron Jay Barnett, Santa Rosa, CA (US);
Gregory Stephen Gonzales, Sebastopol, CA (US);
National Instruments Corporation, Austin, TX (US);
Abstract
A measurement apparatus is disclosed. The measurement apparatus includes a lid configured to be removably affixed to a case. The lid is formed from a substrate composed of a first material. An interior surface of the lid includes a surface coating of a second material. A raised seal is affixed to the substrate and extends beyond the interior surface in a direction orthogonal to the interior surface. The raised seal includes an elastic deformable layer adjacent to the substrate. The raised seal also includes a surface conforming layer configured such that, when the lid is affixed to the case, the surface conforming layer is adjacent to the case along a side opposite the elastic deformable layer. The surface conforming layer is composed of a material of a yield strength less than a normal force generated by fixation of the lid to the case.