The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2015

Filed:

Jan. 22, 2014
Applicant:

Fujifilm Corporation, Minato-ku, Tokyo, JP;

Inventors:

Masashi Ono, Kanagawa, JP;

Masahiro Takata, Kanagawa, JP;

Fumihiko Mochizuki, Kanagawa, JP;

Atsushi Tanaka, Kanagawa, JP;

Masayuki Suzuki, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/339 (2006.01); H01L 21/00 (2006.01); H01L 27/148 (2006.01); H01L 29/66 (2006.01); H01L 29/786 (2006.01); H01L 27/12 (2006.01); H01L 27/146 (2006.01); H01L 21/02 (2006.01); H01L 27/15 (2006.01); H01L 27/32 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66969 (2013.01); H01L 29/7869 (2013.01); H01L 27/1225 (2013.01); H01L 27/14632 (2013.01); H01L 27/14659 (2013.01); H01L 27/14687 (2013.01); H01L 27/148 (2013.01); H01L 21/02565 (2013.01); H01L 27/14612 (2013.01); H01L 27/156 (2013.01); H01L 27/3244 (2013.01); H01L 27/322 (2013.01); H01L 27/3248 (2013.01); H01L 27/3262 (2013.01); H01L 27/14614 (2013.01); H01L 29/66742 (2013.01); H01L 29/78696 (2013.01);
Abstract

There is provided a method of fabricating a field effect transistor including: forming a first oxide semiconductor film on a gate insulation layer disposed on a gate electrode; forming a second oxide semiconductor film on the first oxide semiconductor film, the second oxide semiconductor film differing in cation composition from the first oxide semiconductor film and being lower in electrical conductivity than the first oxide semiconductor film; applying a heat treatment at over 300° C. in an oxidizing atmosphere; forming a third oxide semiconductor film on the second oxide semiconductor film, the third oxide semiconductor film differing in cation composition from the first oxide semiconductor film and being lower in electrical conductivity than the first oxide semiconductor film; applying a heat treatment in an oxidizing atmosphere; and, forming a source electrode and a drain electrode on the third oxide semiconductor film.


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