The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2015

Filed:

Mar. 10, 2009
Applicants:

William Alan Fox, Burlington, NC (US);

Charles L. Carrico, Jr., Burlington, NC (US);

Inventors:

William Alan Fox, Burlington, NC (US);

Charles L. Carrico, Jr., Burlington, NC (US);

Assignee:

TriPath Imaging, Inc., Burlington, NC (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 31/00 (2006.01); G01N 33/00 (2006.01); G01N 9/30 (2006.01); G01N 35/00 (2006.01); B01L 3/00 (2006.01); B04B 11/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/0095 (2013.01); B04B 2011/046 (2013.01); G01N 2035/00495 (2013.01);
Abstract

The invention provides an integrated sequential sample preparation system using a sequential centrifuge for preparing samples for analysis. Methods of more efficiently preparing discrete samples sequentially for subsequent analysis are also provided. The apparatus and methods for sequentially preparing discrete samples provide improved operating efficiencies over conventional preparation processes that use batch centrifugation systems. Such advantages include reducing dwell time, increasing system throughput, reducing sample preparation system footprint, and improving precision of the analytical process. The integrated sequential preparation system with the integrated sequential centrifuge further provides the capability of handling critical or STAT samples without compromising the operating efficiencies achieved by preparing discrete samples in a sequential manner.


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