The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2015

Filed:

Nov. 30, 2012
Applicant:

Hgst Netherlands B.v., Amsterdam, NL;

Inventors:

David P. Druist, Santa Clara, CA (US);

Glenn P. Gee, San Jose, CA (US);

Edward H. Lee, San Jose, CA (US);

David J. Seagle, Morgan Hill, CA (US);

Darrick T. Smith, San Jose, CA (US);

Assignee:

HGST Netherlands, B.V., Amsterdam, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 49/10 (2006.01); B24B 37/013 (2012.01); B24B 37/005 (2012.01); B24B 7/22 (2006.01); H01L 23/00 (2006.01); G11B 5/00 (2006.01);
U.S. Cl.
CPC ...
B24B 37/005 (2013.01); B24B 7/228 (2013.01); H01L 24/05 (2013.01); H01L 24/06 (2013.01); G11B 5/00 (2013.01); H01L 2224/48463 (2013.01); H01L 2224/49107 (2013.01); H01L 2924/3025 (2013.01);
Abstract

Embodiments described herein generally relate to connecting electronic lapping guides (ELGs) to a lapping controller to prevent the effects of current crowding while reducing connections to the ELGs in single pad lapping. Devices and systems can include a row of sliders including a magnetoresistive (MR) element, a plurality of high resistance ELGs connected to both the wafer and to at least one bonding pad and at least two peripheral grounding vias connected to the wafer. Methods and systems include a wafer comprising a plurality of sliders wherein each slider is connected to a lapping controller and the delivery of current to the ELGs is sequential to groups of sliders such that only one group of ELGs is being measured at any time.


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