The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 2015
Filed:
May. 29, 2013
Canon Kabushiki Kaisha, Tokyo, JP;
Kazuya Morohashi, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An ophthalmologic apparatus includes an aberration measurement unit configured to measure aberration caused by a subject's eye by using a return beam of a first measuring beam from the subject's eye, a correction unit configured to correct aberration of a return beam of a second measuring beam from the subject's eye caused by the subject's eye based on the aberration measured by the aberration measurement unit, a first acquisition unit configured to obtain a first image of the subject's eye by using the aberration-corrected return beam of the second measuring beam from the subject's eye, and a control unit configured to enter one of the first measuring beam and the second measuring beam into the subject's eye while limiting entry of the other measuring beams into the subject's eye.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile