The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 2015

Filed:

Jul. 06, 2010
Applicant:

Hann-huei Chiou, Taipei, TW;

Inventor:

Hann-Huei Chiou, Taipei, TW;

Assignee:

Getac Technology Corporation, Hsinchu County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/10 (2006.01); G06K 7/14 (2006.01);
U.S. Cl.
CPC ...
G06K 7/10544 (2013.01); G06K 7/146 (2013.01); G06K 7/1465 (2013.01); G06K 7/1095 (2013.01);
Abstract

An automatic testing method applied to an automatic testing system for testing a barcode identification apparatus is described. In the method, a test host is utilized to generate a barcode pattern automatically, so as to display the barcode pattern through a barcode revealing apparatus. The barcode identification apparatus reads and resolves the barcode pattern to retrieve an identification result. The identification result is returned to the test host. The test host compares the barcode information carried by the barcode pattern and the identification result, and generates a test result. The test host repetitively generates the barcode pattern for a barcode identification apparatus carried the barcode pattern and the identification result, and then generates a test result. Through the test host repeatedly generates the barcode pattern and records the corresponding test result, manual operation is not required to obtain testing data for being analyzed.


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