The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2015

Filed:

Aug. 15, 2011
Applicants:

Jeffrey D. Myers, Somerville, MA (US);

Ran Gilboa, Cambridge, MA (US);

Dongjun Sun, Shrewsbury, MA (US);

Inventors:

Jeffrey D. Myers, Somerville, MA (US);

Ran Gilboa, Cambridge, MA (US);

Dongjun Sun, Shrewsbury, MA (US);

Assignee:

Netapp, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

Machine implemented method and system is provided for managing resources within an operating environment having a plurality of computing systems and a plurality of virtual machines. The resources are monitored and resource utilization is compared to configured threshold values for managing over utilization. If resource utilization reaches the threshold value, then the resource is identified as being over utilized. One or more data structures are used to display and verify the over utilization on a display device. The root cause of the over utilization is identified and then corrective action may be taken to reduce the over utilization.


Find Patent Forward Citations

Loading…