The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 2015
Filed:
Aug. 03, 2012
Marcus Wefers, Heidelberg, DE;
Reinhold Konnerth, Dielheim, DE;
Thierry Lieu, Grasse, FR;
Abdelhak Nezzari, Cannes la Bocca, FR;
Michael Schaffrath, Leipzig, DE;
Torsten Kamenz, Wiesloch, DE;
Andreas Kemmler, Boennigheim, DE;
Marcus Wefers, Heidelberg, DE;
Reinhold Konnerth, Dielheim, DE;
Thierry Lieu, Grasse, FR;
Abdelhak Nezzari, Cannes la Bocca, FR;
Michael Schaffrath, Leipzig, DE;
Torsten Kamenz, Wiesloch, DE;
Andreas Kemmler, Boennigheim, DE;
SAP SE, Walldorf, DE;
Abstract
Various embodiments include at least one or systems, methods, and software providing abilities to automatically generate a test plan that mitigates risk involved in testing less than an entirety of a software system following modification. Some embodiments operate to allow a user to influence the scope of an optimized test plan while also reducing a number of tests and test execution effort involved. Such embodiments may identify portions of the software system to test and portions of the software system that will not be tested in a manner that reduces a total testing effort involved. Reductions in testing effort are performed in generation of the test plan in view of testing preferences which are utilized not only to reduce the total effort in executing a test plan, but also does so to optimize the test plan.