The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2015

Filed:

Oct. 05, 2012
Applicant:

Electronics & Telecommunications Research Institute, Daejeon, KR;

Inventors:

Yu Seung Ma, Daejeon, KR;

Duk Kyun Woo, Daejeon, KR;

Seon Tae Kim, Daejeon, KR;

Pyeong Soo Mah, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A fault-based software testing method and system are provided. The fault-based software testing method includes: generating a plurality of error programs by injecting faults into a testing target program; grouping the generated error programs into a plurality of groups with respect to respective test data, and selecting representative error programs with respect to the respective groups; and when an error is detected in the execution result of the representative error programs with respect to the corresponding test data, determining that errors are detected in all the error programs of the corresponding group.


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